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    Second-Generation Vector Signal Transceiver from NI

    To solve the most demanding RF design and test applications

    NI 1New vector signal transceiver has 5X the bandwidth, a 33% smaller footprint and larger user-programmable FPGA

    NI , the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, today announced a second-generation vector signal transceiver (VST). The NI PXIe-5840 module is the world’s first 1 GHz bandwidth VST and is designed to solve the most challenging RF design and test applications.

    “NI redefined instrumentation in 2012 by introducing the industry’s first VST with an FPGA programmable by LabVIEW to accelerate the pace of design and lower the cost of test,” said Olga Yashkova, program manager for communications test and measurement practice at Frost & Sullivan. “The second-generation VST demonstrates NI’s continued empowerment of engineers with software-designed instrumentation to stay ahead of the complex and rapidly changing wireless technologies and requirements with the most innovative RF test, measurement and prototyping solutions in the market.”

    The NI PXIe-5840 combines a 6.5 GHz RF vector signal generator, 6.5 GHz vector signal analyzer, high-performance user-programmable FPGA and high-speed serial and parallel digital interfaces into a single 2-slot PXI Express module. With 1 GHz of bandwidth, the latest VST is ideally suited for a wide range of applications including 802.11ac/ax device testing, mobile/Internet of Things device testing, 5G design and testing, RFIC testing, radar prototyping and more.

    “Although engineers can use the second-generation VST to solve many advanced RF test applications right out of the box, its software-designed architecture enables engineers to uniquely customize the user-programmable FPGA,” said Charles Schroeder, vice president of product marketing, RF at NI. “Using the intuitive LabVIEW system design software, engineers can transform the VST into exactly what they need it to be at the firmware level and ultimately address the most demanding test and measurement challenges. This instrument is an unparalleled example of a product that delivers the RF performance required for traditional test and measurement and the flexibility of a software defined radio.”

    Product Features:

    • 1 GHz of instantaneous bandwidth for advanced digital pre-distortion (DPD) test and wideband signals such as radar, LTE-Advanced Pro and 5G
    • Excellent measurement accuracy that enables the second-generation VST to measure 802.11ax Error Vector Magnitude (EVM) performance of -50 dB
    • Measurement speeds up to 10X faster than traditional instrumentation using FPGA-based measurement acceleration and highly optimized measurement software
    • Small size and tight synchronization allowing for up to 8×8 multiple input, multiple output (MIMO) configuration in a single 18-slot chassis
    • User-programmable FPGA that engineers can easily design with LabVIEW

    “The combination of the industry’s widest bandwidth and low latency software-designed instrument allowed us to discover our automotive radar sensors as never before, and even allowed us to identify problems very early in the design phase that were previously impossible to catch,” said Niels Koch, component owner radar systems, Audi AG. “With the VST and FPGA programmable by LabVIEW, we were able to rapidly emulate a wide range of diverse scenarios, thus influencing safety and reliability aspects in autonomous driving.”

    The VST is a vital part of the NI platform and ecosystem that engineers can use to build smarter test systems. These test systems benefit from more than 600 PXI products ranging from DC to mmWave. They feature high-throughput data movement using PCI Express Gen 3 bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. Users can take advantage of the productivity of the LabVIEW and NI TestStand software environments, along with a vibrant ecosystem of partners, add-on IP and applications engineers, to help dramatically lower the cost of test, reduce time to market and future-proof testers for tomorrow’s challenging requirements.

    To learn more about the second-generation VST, visit www.ni.com/vst/.

    ELE Times Bureau
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